Aehr Test Systems Культура компании

Mr. Mark D. Allison has been Vice President of Worldwide Sales at Aehr Test Systems since August 12, 2013. Mr. Allison served as Vice President, Strategic Marketing and Executive Vice President of Marketing of Verigy, Ltd., a leader in the ATE business that was acquired by Advantest in 2011 for $1.1 billion Mr. Allison joined Verigy in 2006 as Senior Director of Marketing with responsibility for product marketing, business development, learning products and applications for the Memory Test business. Prior to Verigy, Mr. Allison held various sales, marketing, general management and test engineering positions at companies including Advantest, Integrated Measurement Systems, Megatest, Micron and Texas Instruments. Mr. Allison has more than 30 years of progressive semiconductor test industry experience through management positions in engineering, applications, sales and marketing at Advantest, Electroglas, Credence, IMS, Megatest, Micron Technology and Texas Instruments. Mr. Allison served as the Vice President and General Manager of Memory Division of Integrated Measurement Systems since 1998. Mr. Allison joined Integrated Measurement Systems Inc. in November 1995 as Vice President of Marketing. Prior to that, Mr. Allison served as a Director of Memory Marketing for Credence Systems Corporation since 1995 and Director of Marketing of Megatest Corporation, from 1985 to 1995. At TI, Mr. Allison co-developed a method for parallel testing of DRAM's, for which a patent was awarded in 1987. Mr. Allison holds a BSEE from the University of Notre Dame.

Mr. Rhea J. Posedel is the Founder of Aehr Test Systems and has been its Chairman since March 5, 2013. Mr. Posedel served as the Chief Executive Officer of Aehr Test Systems from 1077 to January 3, 2012. From 1977 to May 2000, he also served as President of Aehr Test Systems. Prior to founding Aehr Test Systems, he held various project engineering and engineering managerial positions at Lockheed Martin Corporation, Ampex Corporation and Cohu, Inc. He served as an Executive Chairman of Aehr Test Systems from 1997 to March 5, 2013. He has been a Director of Aehr Test Systems since 1997. Mr. Posedel received a B.S. in Electrical Engineering from the University of California, Berkeley, an M.S. in Electrical Engineering from San Jose State University and an M.B.A. from Golden Gate University.

Mr. Kenneth B. Spink, also known as Ken, has been the Chief Financial Officer , Vice President of Finance and Secretary at Aehr Test Systems since September 9, 2015. Mr. Spink served as Corporate Controller of Aehr Test Systems from 2008 to September 9, 2015. He served at Aehr Test Systems for seven years and has more than 30 years of accounting and finance experience in the high tech, public accounting, leasing, service and construction industries. Mr. Spink served as Corporate Accounting Manager at Applied Materials and began his career with accounting firm Deloitte. Mr. Spink received his Bachelor of Science in Business Administration degree from California State University, Hayward.

Mr. David S. L. Fucci, also known as Dave, has been Vice President of Operations at Aehr Test Systems since June 02, 2014. Mr. Fucci has to oversee manufacturing operations and execution of the roll out and ramp of the Company's new ABTS(TM) Advance Burn-in and Test systems and FOX(TM) wafer level test solutions. Mr. Fucci served as Vice President of Quality, Compliance and Infrastructure at DCG Systems, Inc. since July 30, 2012 and served as its Vice President of Operations. Mr. Fucci is a senior manufacturing executive with more than 25 years of experience in manufacturing operations, supply chain management and new product introduction of high technology solutions. Mr. Fucci served as Director of Manufacturing at Optonics, Inc. from 2000 to 2003. Prior to joining DCG Systems Mr. Fucci served in various positions at Credence Systems including Sr. Director of the Electrical Failure Analysis Product Group, Sr. Director of Circuit Analysis Product Management and over six years as Director of Operations. Mr. Fucci received a BSEE from Northeastern University and an MBA from Boston University.

Mr. Kunio Sano has been President of Aehr Test Systems Japan K.K. at Aehr Test Systems since January 2001. Mr. Sano joined Aehr Test Systems as Vice President, Aehr Test Systems Japan K.K., Aehr Test Systems's subsidiary in Japan, in June 1998. From 1991 to 1998, Mr. Sano served as Manager of Development Engineering Department at Tokyo Electron Yamanashi Limited, a leading worldwide semiconductor equipment manufacturer. Mr. Sano received a B.S.E.E. from Sagami Institute of Technology in Kanagawa, Japan.

Dave Fucci serves as the Vice President of Operations of Aehr Test Systems. Dave started at Aehr Test Systems in June of 2014. Dave currently resides in San Francisco Bay Area.

Don nd serves as the Vice President Of Engineering of Aehr Test Systems. Don currently resides in the San Francisco Bay Area.