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Juergen Frosien ā Head of Integrated Circuit Testing R&D - Process Diagnostics & Control at Applied Materials
Executive Bio
Dr. Juergen Frosien serves as Head of Integrated Circuit Testing R&D - Process Diagnostics & Control at Applied Materials, Inc. Dr. Frosien serves as head of Integrated Circuit Testing (ICT) R&D for Applied Materials and manages ICT GmbH, a subsidiary of Applied Materials Israel's Process Diagnostics and Control (PDC) division. He is responsible for the development and production of all E-Beam columns for PDC products, including: SEMVision G4, CD SEM Verity 4i and the Elite multi-column Electron Beam Inspection. He is considered one of the world's leading experts in Charged Particles Optics. He received the Applied Materials Hall of Fame Patent Award in 2008 for the invention of the SEMVision column, the PDC division's most successful product to date. Since joining t in 2002, he has filed 43 patent applications and has been granted 35 U.S patents. Dr. Frosien was named an Applied Materials Fellow in 2006. He holds a Ph.D. in engineering from the Technical University of Berlin, Germany.
Executive Team Culture Ratings from Applied Materials Employees
TOP
20%
Applied Materials' Executive Team scores in the Top 20%
of similar sized companies on Comparably
of similar sized companies on Comparably
Not Enough Ratings To Show Who Ranks Executive Team the Lowest
Anonymously rate my experience at Applied MaterialsApplied Materials' Executive Team at a Glance
Based on 8 ratings, Applied Materials' employees are satisfied with their Executive Team and give them a āB+ā or 73/100.
Applied Materials' Executive Team ranks in the Top 40% of other companies in San Francisco and Top 20% of other companies on Comparably that also have 10,000+ Employees.
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